Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano David G. Seiler

ISBN: 9780735404410

Published: September 1st 2007

Hardcover

578 pages


Description

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano  by  David G. Seiler

Frontiers of Characterization and Metrology for Nanoelectronics: 2007 International Conference on Frontiers of Characterization and Metrology for Nano by David G. Seiler
September 1st 2007 | Hardcover | PDF, EPUB, FB2, DjVu, AUDIO, mp3, RTF | 578 pages | ISBN: 9780735404410 | 8.46 Mb

This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.MoreThis book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology. It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.

It provides an effective portrayal of the industry s characterization and metrology needs and how they are being addressed. It also offers a foundation for further advances in metrology and new ideas for research and development.



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